发明名称 Verfahren zur Stabilisierung oder Steuerung der Oberflaecheneigenschaften eines kristallinen Halbleiterplaettchens
摘要 A wafer of germanium, silicon, or germanium-silicon alloy is halogenated and then treated with a reactive alkylating agent. In a typical example a germanium wafer including a PN junction, after etching in a saturated solution of oxalic acid in hydrogen peroxide, is heated first in pure argon or nitrogen and then at 85 DEG C. for 10 minutes in a flow of equal volumes of hydrogen chloride and chlorine or hydrogen bromide and bromine. After repeating these steps and cooling in inert gas the wafer is immersed in ethyl magnesium bromide, lithium ethyl, propyl or butyl, or butyl magnesium bromide. Finally it is rinsed in ammonium chloride or acetic acid. In treating silicon and germanium-silico alloy butyl magnesium bromide and isopropyl magnesium bromide respectively are used as alkylating agents.
申请公布号 DE1243943(B) 申请公布日期 1967.07.06
申请号 DE1962R032745 申请日期 1962.05.18
申请人 RADIO CORPORATION OF AMERICA 发明人 AMICK JAMES ALBERT;CULLEN GLENN WHERRY
分类号 C23C8/80;C23C22/02;H01L23/29 主分类号 C23C8/80
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