发明名称 |
METHOD OF MANUFACTURING STRUCTURE BY ANISOTROPIC ETCHING, AND SILICON SUBSTRATE WITH ETCHING MASK |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a structure capable of reducing the space for disposing a correction etching mask when anisotropic-etching the structure and capable of arranging a number of structures on a silicon wafer, and to provide a silicon substrate with the etching mask. SOLUTION: In the method of manufacturing the structure and the silicon substrate with the etching mask, a basic etching mask 103 corresponding to a target shape having a convex corner and the correction etching mask 107 are formed on a single crystal silicon substrate 100. A first part of the correction etching mask 107 extends to the direction of <110>, the both ends are joined with the basic etching mask and the one end is joined to the convex corner of the basic etching mask 103. A second part is bonded to the first part at the side extending to the direction of <110> of the first part and has a convex corner. An opening extends crossing over the border where the first part and the second part are bonded. COPYRIGHT: (C)2010,JPO&INPIT
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申请公布号 |
JP2010062336(A) |
申请公布日期 |
2010.03.18 |
申请号 |
JP20080226542 |
申请日期 |
2008.09.04 |
申请人 |
CANON INC |
发明人 |
OGAWA TOSHIYUKI;KATO TAKAHISA;TORASHIMA KAZUTOSHI;AKIYAMA TAKAHIRO |
分类号 |
H01L21/306;B81B3/00;B81C1/00;G02B26/08;G02B26/10;G03F7/20 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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