发明名称 METHOD FOR CORRECTION OF LAYOUT WITH CHANGE SECTION OF PITCH
摘要 PURPOSE: A method for correcting layout including a pitch change section is provided to prevent degradation of a contrast at a pitch change section by chopping a layout of the pitch change section. CONSTITUTION: A pattern layout including a pitch change section is arranged. The pitch change section is detected from the pattern layout(S100). Aerial image intensity of a region including the pitch change section is measured by a simulation operation(S110). A pitch of the layout of the pitch change section is corrected based on critical intensity(S120). The layout correction is performed by comparing the image intensity of a reference region with the image intensity of the pitch-corrected layout(S130,S150).
申请公布号 KR20090132290(A) 申请公布日期 2009.12.30
申请号 KR20080058486 申请日期 2008.06.20
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, CHAN HA
分类号 H01L21/027 主分类号 H01L21/027
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