发明名称 MONITORED BURN-IN TEST APPARATUS AND MONITORED BURN-IN TEST METHOD
摘要 A monitored burn-in test method includes: subjecting an element set, including elements, to a writing process for writing data into each of the elements, the elements requiring a refresh process; subjecting the element set to the refresh process after the writing process; and interrupting the refresh process for a selected one or ones of the elements, when instructions for readout of data are supplied to the selected one or ones during the refresh process, and subjecting the selected one or ones to a readout process in accordance with the instructions.
申请公布号 US2009287362(A1) 申请公布日期 2009.11.19
申请号 US20090533504 申请日期 2009.07.31
申请人 FUJITSU LIMITED 发明人 MAESAKI YOSHIHIRO;TESHIGAWARA HIROSHI;KODAIRA YUKIHIKO;SEKIGUCHI NAOE
分类号 G05D23/19;G11C7/00;G11C29/00 主分类号 G05D23/19
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