发明名称 |
Interferometric synthetic aperture microscopy |
摘要 |
Methods and apparatus for three-dimensional imaging of a sample. A source is provided of a beam of substantially collimated light characterized by a temporally dependent spectrum. The beam is focused in a plane characterized by a fixed displacement along the propagation axis of the beam, and scattered light from the sample is superposed with a reference beam derived from the substantially collimated source onto a focal plane detector array to provide an interference signal. A forward scattering model is derived relating measured data to structure of an object to allow solution of an inverse scattering problem based upon the interference signal so that a three-dimensional structure of the sample may be inferred in near real time.
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申请公布号 |
US7602501(B2) |
申请公布日期 |
2009.10.13 |
申请号 |
US20070775572 |
申请日期 |
2007.07.10 |
申请人 |
THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS |
发明人 |
RALSTON TYLER S.;MARKS DANIEL L.;CARNEY PAUL SCOTT;BOPPART STEPHEN A. |
分类号 |
G01B11/02 |
主分类号 |
G01B11/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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