发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a semiconductor device is provided to improve the reliability of a semiconductor device through reduction of resistance of a word line. CONSTITUTION: A method for fabricating a semiconductor device is comprised of the steps: forming a plurality of pillar patterns on a substrate(31); burying a first conductive films to fill the pillar pattern gap; forming a first hard mask layer pattern on adjacent pillar patterns in one direction; etching a first conductive film with a first hard mask layer pattern as an etching barrier; forming a second mask pattern on a pillar patterns which are adjacent in the other direction; and etching the first conductive film with a second hard mask pattern as an etching barrier and forming the gate electrode surrounding the pillar pattern.
申请公布号 KR20090106009(A) 申请公布日期 2009.10.08
申请号 KR20080031469 申请日期 2008.04.04
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, YUN SEOK;JUNG, YOUNG KYUN;LEE, CHUN HEE
分类号 H01L21/336;H01L21/98 主分类号 H01L21/336
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