发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a semiconductor device is provided to improve the reliability of a semiconductor device through reduction of resistance of a word line. CONSTITUTION: A method for fabricating a semiconductor device is comprised of the steps: forming a plurality of pillar patterns on a substrate(31); burying a first conductive films to fill the pillar pattern gap; forming a first hard mask layer pattern on adjacent pillar patterns in one direction; etching a first conductive film with a first hard mask layer pattern as an etching barrier; forming a second mask pattern on a pillar patterns which are adjacent in the other direction; and etching the first conductive film with a second hard mask pattern as an etching barrier and forming the gate electrode surrounding the pillar pattern.
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申请公布号 |
KR20090106009(A) |
申请公布日期 |
2009.10.08 |
申请号 |
KR20080031469 |
申请日期 |
2008.04.04 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, YUN SEOK;JUNG, YOUNG KYUN;LEE, CHUN HEE |
分类号 |
H01L21/336;H01L21/98 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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