发明名称 X-RAY INSPECTION DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an X-ray inspection device capable of making better the image connection than before even for the samples where unevenness is present, at the time of partial fluoroscopic images connected for reconstructing into a whole fluoroscopic image. <P>SOLUTION: At the time of connecting partial fluoroscopic images adjacent to each other, regarding both the partial fluoroscopic images, based on the brightness information of the pixels in the neighboring regions of the sides to be mutually connected, using the brightness information of a portion of the pixels among pixels in the region, e.g. the pixel group brighter than the average value of the brightness of that region, the parts in which the distributions of the brightness information along the sides are mutually most similar in both the partial fluoroscopic images are determined as the parts to be mutually connected, and connected. Thereby, in the sample etc. having unevenness, the connection focused on the thin part in sample thickness is realized on the whole fluoroscopic image, the sense of discomfort due to connection can be inhibited. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2009222661(A) 申请公布日期 2009.10.01
申请号 JP20080069657 申请日期 2008.03.18
申请人 SHIMADZU CORP 发明人 TATEZAWA YOSHIHIRO
分类号 G01N23/04;G06T1/00;G06T3/00 主分类号 G01N23/04
代理机构 代理人
主权项
地址