发明名称 Semiconductor package for a large die
摘要 A semiconductor package is provided. A semiconductor package has a die pad and a plurality of bonding fingers. A spacer is attached to the die pad, and a large die is attached to the spacer. The large die is wire bonded to the plurality of bonding fingers using a plurality of bonding wires. The die pad, plurality of bonding fingers, spacer, large die, and bonding wires are encapsulated to form the semiconductor package. The semiconductor package can be either a single or dual row package, such as a QFN or BGA package.
申请公布号 US7595551(B2) 申请公布日期 2009.09.29
申请号 US20050169850 申请日期 2005.06.28
申请人 ST ASSEMBLY TEST SERVICES LTD. 发明人 RAMAKRISHNA KAMBHAMPATI
分类号 H01L23/02;H01L23/16;H01L23/31;H01L23/433;H01L23/492;H01L23/495 主分类号 H01L23/02
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