发明名称 |
PLASMA TREATMENT APPARATUS OF SUBSTRATE AND PLASMA TREATMENT METHOD THEREOF |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a plasma treatment apparatus of a substrate, which can accurately process a substrate by increasing a radical species density suitable for substrate processing, can control ion radical energy to an energy value suitable for substrate processing and to a small band energy width, and can form an excellent embedded film, and to provide a plasma treatment method thereof. <P>SOLUTION: The plasma treatment apparatus includes: a substrate holding electrode 22 and an opposite electrode 23 which are disposed in a chamber 21; a high-frequency generator 27 for applying a high frequency of ≥50 MHz to the substrate holding electrode 22; a DC negative pulse generator 29 for applying a DC negative pulse voltage so that the voltage is superimposed over the high frequency; and a controller 30 for controlling so that the high frequency can be intermittently applied and the DC negative pulse voltage can be intermittently applied in response to a timing of turning ON/OFF the high frequency. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009187975(A) |
申请公布日期 |
2009.08.20 |
申请号 |
JP20080023066 |
申请日期 |
2008.02.01 |
申请人 |
TOSHIBA CORP;TOKYO ELECTRON LTD |
发明人 |
UI AKIO;TAMAOKI NAOKI;ICHIKAWA HISASHI;HAYASHI HISATAKA;KAMINATSUI KEN;HIMORI SHINJI;YAMADA NORIKAZU;OSE TAKESHI;ABE ATSUSHI |
分类号 |
H01L21/3065;C23C16/509;H01L21/205;H05H1/46 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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