发明名称 METHOD OF FORMING RESIST PATTERN BY NANOIMPRINT LITHOGRAPHY
摘要 A method of forming a resist pattern of high aspect ratio excelling in etching resistance by the use of nanoimprint lithography. The method of forming a resist pattern by nanoimprint lithography comprises the steps of disposing organic layer (4) on support (1); providing resist layer (2) on the organic layer (4) with the use of chemical amplification type negative resist composition containing silsesquioxane resin (A); pressing light transmission allowing mold (3) with partial light shielding portion (5) against the resist layer (2) and thereafter carrying out exposure from the upside of the mold (3); and detaching the mold (3).
申请公布号 US2009189317(A1) 申请公布日期 2009.07.30
申请号 US20070303434 申请日期 2007.05.30
申请人 TOKYO OHKA KOGYO CO., LTD 发明人 SATO KAZUFUMI;YAMADA TOMOTAKA
分类号 B29C59/16;B81C99/00 主分类号 B29C59/16
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