| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of recovering deteriorated electric characteristics by detecting the deterioration of a buffer circuit without stopping the operation of the buffer circuit. <P>SOLUTION: A replica buffer circuit includes the same circuit as a main buffer circuit, and outputs a replica output signal upon receiving a replica input signal or a check signal. A reference buffer circuit outputs a reference output signal upon receiving the check signal. A determination circuit activates a detection signal in response to a fact that a replica output signal outputted from the replica buffer circuit synchronizing with the check signal is delayed to the reference output signal. A sub-buffer circuit receives a real input signal during activating the detection signal and outputs a sub-real output signal to an output terminal of the main buffer circuit. Thus, the deterioration of the main buffer circuit can be determined without stopping the operation of the main buffer circuit, and the deterioration of the main buffer circuit can be compensated by the sub-buffer circuit. <P>COPYRIGHT: (C)2009,JPO&INPIT</p> |
