发明名称 MULTIBEAM SYSTEM
摘要 <p>A multibeam system in which a charged particle beam and one or more additional beams can be directed to the target within a single vacuum chamber. A first beam column preferably produces a beam for rapid processing, and a second beam column produces a beam for more precise processing. A third beam column can be used to produce a beam useful for forming an image of the sample while producing little or no change in the sample.</p>
申请公布号 WO2009089499(A2) 申请公布日期 2009.07.16
申请号 WO2009US30671 申请日期 2009.01.09
申请人 FEI COMPANY;MILLER, TOM;UTLAUT, MARK W.;SMITH, NOEL;TESCH, PAUL P.;NARUM, DAVID H.;HENRY, CRAIG;HONG, LIANG;STONE, STACEY;TUGGLE, DAVID 发明人 UTLAUT, MARK W.;SMITH, NOEL;TESCH, PAUL P.;MILLER, TOM;NARUM, DAVID H.;HENRY, CRAIG;HONG, LIANG;STONE, STACEY;TUGGLE, DAVID
分类号 H01L21/027 主分类号 H01L21/027
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