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发明名称
显微镜校准装置及方法及具有校准装置之基台
摘要
本发明揭示一种用于支撑一试样载玻片且用于校准一显微镜之基台,该基台包含一基座及一与该基座成一整体之校准组件。该校准组件包含用于位置校准之至少一个校准元件及用于光学校准之至少一个校准元件。可在不需要独立校准载玻片之情况下来执行该显微镜之校准。该校准组件可系一玻璃校准组件,或可由一穿过该基座形成或蚀刻之校准元件来界定。
申请公布号
TW200931060
申请公布日期
2009.07.16
申请号
TW097143547
申请日期
2008.11.11
申请人
塞泰公司
发明人
罗伯特 简宁斯
分类号
G02B21/32(2006.01)
主分类号
G02B21/32(2006.01)
代理机构
代理人
陈长文
主权项
地址
美国
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