发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device having high pickup accuracy of a semiconductor chip by suppressing the disturbance of alignment of a semiconductor chip after dicing, even if a dicing tape having a rigid layer is used. SOLUTION: The manufacturing method of semiconductor devices has a first process for applying a semiconductor wafer 16 onto an adhesive layer of the dicing tape 12, where a base material layer, a rigid layer, and an adhesive layer are laminated successively; a second process for performing dicing so that a groove is formed in the rigid layer; and a third process for separating the semiconductor chip 10 from the adhesive layer, by applying a load from a side opposite to a side, having the semiconductor wafer 16 of the base material layer. In the manufacturing method of semiconductor devices, at least one of dicing lines formed in the second process is positioned, at a region to which semiconductor wafers 16 are not stuck. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009130333(A) 申请公布日期 2009.06.11
申请号 JP20070307247 申请日期 2007.11.28
申请人 OKI SEMICONDUCTOR CO LTD;OKI SEMICONDUCTOR TAMA CO LTD;RIKEN TECHNOS CORP 发明人 MORITA HIROMI;HANADA TSUNEO;SUGANUMA KOTO
分类号 H01L21/301;C09J7/02 主分类号 H01L21/301
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