| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that it is difficult to improve the yield in a semiconductor integrated circuit. SOLUTION: With the use of a method for designing the semiconductor integrated circuit, a plurality of semiconductor chips with a plurality of functional macros are formed so as to generate a base wafer. Then, the plurality of functional macros of the plurality of semiconductor chips are tested so as to generate macro test information. The macro to be prohibited in usage is selected among the plurality of functional macros, based on the macro test information and the net list of a user circuit. A test is performed in a base wafer state, thereby improving the yield in manufacturing the semiconductor integrated circuit. COPYRIGHT: (C)2009,JPO&INPIT |
