INTEGRATED CIRCUIT TEST SYSTEM AND METHOD WITH TEST DRIVER SHARING

摘要

An integrated circuit test system and method for testing integrated circuits or chips is disclosed. One embodiment provides a test signal from a test driver via a primary test channel and distributed via parallel wiring paths to a plurality of contact pads of one or more integrated circuits or chips under test. At least one operational amplifier is arranged in the wiring path connected to the contact pads of the integrated circuits or chips.