发明名称 MOS transistor on an SOI substrate with a body contact and a gate insulating film with variable thickness
摘要 It is an object to provide an SOI device capable of carrying out body fixation and implementing a quick and stable operation. A gate insulating film (11) having a thickness of 1 to 5 nm is provided between a portion other than a gate contact pad (GP) of a gate electrode (12) and an SOI layer (3), and a gate insulating film (110) having a thickness of 5 to 15 nm is provided between the gate contact pad (GP) and the SOI layer (3). The gate insulating film (11) and the gate insulating film (110) are provided continuously.
申请公布号 US7504291(B2) 申请公布日期 2009.03.17
申请号 US20070929626 申请日期 2007.10.30
申请人 RENESAS TECHNOLOGY CORP. 发明人 MAEDA SHIGENOBU;MATSUMOTO TAKUJI;IWAMATSU TOSHIAKI;IPPOSHI TAKASHI
分类号 H01L21/84;H01L27/08;H01L21/336;H01L21/8238;H01L27/092;H01L27/12;H01L29/423;H01L29/786 主分类号 H01L21/84
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