| 摘要 |
<p>The method involves equipping a module test location with detector modules (D1, Dn, D42) that are to be measured and qualified. Channel-specific characteristic lines of all analog-to-digital converter devices of each detector module are determined with a fixed tube voltage, a variation of X-ray intensity that is done based on a variation of absorber thickness of absorber-phantoms, and a variation of tube current. Variance values, which characterize the deviation of characteristic lines from a linearity line, are determined. An independent claim is also included for a system for measuring and qualifying detector modules for assembly of modular detector systems in computer tomography devices.</p> |
