发明名称 |
SEMICONDUCTOR DEVICE HAVING CONTACT FAILURE DETECTOR |
摘要 |
A semiconductor device having a circuit for detecting a defective connection to the semiconductor device. A semiconductor device including multiple internal circuits; multiple pads respectively connected to the internal circuits; and a contact failure detector coupled between the pads and a common node and configured to detect contact failures between tips of a probe card and the pads.
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申请公布号 |
US2009039909(A1) |
申请公布日期 |
2009.02.12 |
申请号 |
US20080179169 |
申请日期 |
2008.07.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM GWANG-YOUNG;KIM JONG-YOUB;JUNG BOUNG-LYOUL;JI JOON-SU |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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