发明名称 METHOD FOR PRODUCING PROBE CARD
摘要 A method for manufacturing a probe card is provided to form a probe tip to correspond to a minute pitch by using a part of a trench region as a mold for the probe tip. A trench is formed by etching and removing a predetermined region of a sacrificial substrate. Photoresist layers(140,160) are formed by coating the photosensitive material on the sacrificial substrate(100) to fill the trench. The mold for a body part(150) of the probe is formed by etching and removing a bar region which is extended from the trench as long as the regular length while including a part of the region corresponding to the trench in the photoresist layer. The body part of the probe is formed by using the conductive material in the mold.
申请公布号 KR20080114095(A) 申请公布日期 2008.12.31
申请号 KR20070063330 申请日期 2007.06.26
申请人 SECRON CO., LTD. 发明人 KIM, YOUNG JIN
分类号 H01L21/66 主分类号 H01L21/66
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