发明名称 MANUFACTURING METHOD OF CAPACITOR
摘要 PROBLEM TO BE SOLVED: To manufacture a capacitor with a high yield which prevents an increase in a leak current of a dielectric layer, and generation of a short-circuit fault. SOLUTION: A manufacturing method of the capacitor 1 includes a process to form the dielectric layer 3 on a lower part electrode 2, a process to form a resin insulator 5, and a process to form an upper part electrode 4 after the resin insulator 5 is formed, wherein the resin insulator is selectively formed on a portion through which a current flows in the dielectric layer 3, using an electrophoresis method after the dielectric layer 3 is formed. The capacitor 1 is manufactured so that the leak current of the dielectric layer 3 may become 1×10<SP>-6</SP>A/cm<SP>2</SP>or less when a voltage of 2V is applied between the lower part electrode 2 and the upper part electrode 4. In the process to form the resin insulator 5, a voltage applied when the resin insulator 5 is formed using the electrophoresis method is set to range from 2 to 50 V, and time to apply the voltage is set to range from 0.5 to 500 milliseconds. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008160040(A) 申请公布日期 2008.07.10
申请号 JP20060350387 申请日期 2006.12.26
申请人 TDK CORP 发明人 OZAKI YUMIKO;SHINOURA OSAMU
分类号 H01G4/12;H01G4/33 主分类号 H01G4/12
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