| 摘要 |
A connection structure and an electrical inspection apparatus having the same are provided to reduce contact resistance between first and second substrates by expanding a contact area between a connecting unit and a pad. An electrical inspection apparatus(100) includes first and second substrates(10,16), connecting units(25), and first guides. The first substrate has a first surface(10a) with probe tips(12) in contact with an object to be inspected and a second surface(10b) opposite to the first surface. The second surface has pads(14) in contact with the object to be inspected to receive electrical signals from the probe tips. The second substrate faces the second surface of the first substrate and receives the electrical signals from the pads. The connecting units have a bent structure, are positioned between the first and second substrates, and contact the pads respectively to connect the first and second substrates electrically. The first guides are formed on the pads respectively and partially contact the connecting units. |
