INTEGRATED CIRCUIT FOR BEING APPLIED TO ELECTRONIC DEVICE, AND ASSOCIATED TESTING SYSTEM

摘要

An integrated circuit (IC) for being applied to an electronic device includes: a control circuit for controlling the electronic device; and a signal generation unit coupled to the control circuit for generating at least one signal inside the IC as an output signal and outputting the output signal to another IC for testing. A testing system includes at least one testing device and a plurality of ICs that are tested by the testing device. The ICs are coupled to the testing device. Each IC of the ICs is for being applied to an electronic device and includes: a control circuit for controlling the electronic device; and a signal generation unit coupled to the control circuit for generating at least one signal inside the IC as an output signal and outputting the output signal to one of the other IC(s) for testing.