发明名称 EXPOSURE MASK AND METHOD FOR MANUFACTURING OF SEMICONDUCTOR DEVICE USING THE SAME
摘要 <p>An exposure mask and a method for manufacturing a semiconductor device are provided to simplify the manufacturing process by preventing generation of scum without a de-scum process. An exposure mask includes a transparent substrate(220) and a light shielding pattern(210) formed on the transparent substrate corresponding to a bit line contact region. A method for manufacturing a semiconductor device includes the steps of forming a negative photoresist layer on a semiconductor substrate including a gate pattern, exposing the negative photoresist layer, and forming a photoresist pattern(170) to expose the bit line contact region by performing a developing process.</p>
申请公布号 KR20080060022(A) 申请公布日期 2008.07.01
申请号 KR20060134078 申请日期 2006.12.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, JEONG WON
分类号 H01L21/027;H01L21/336 主分类号 H01L21/027
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