发明名称 |
Method of testing apparatus having master logic unit and slave logic unit |
摘要 |
An apparatus which is tested includes a master logic unit and a slave logic unit. The testing method includes accessing a virtual slave logic unit by a test pattern which includes an address for accessing and an expected value of a waiting time, returning a response value from the virtual slave logic unit which is accessed by the address after lapse of the waiting time, and comparing the expected value and the response value.
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申请公布号 |
US7363565(B2) |
申请公布日期 |
2008.04.22 |
申请号 |
US20050055629 |
申请日期 |
2005.02.11 |
申请人 |
OKI ELECTRIC INDUSTRY CO., LTD. |
发明人 |
MURANISHI KOJI |
分类号 |
G01R31/28;G06F11/22;G06F11/00;G06F13/00;G11C29/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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