发明名称 ACCURACY CONTROL SYSTEM, ANALYZER, AND ACCURACY CONTROL METHOD
摘要 PROBLEM TO BE SOLVED: To provide an accuracy control system capable of performing accuracy control more properly than before. SOLUTION: This accuracy control system comprising a plurality of analyzers and a control device connected to the analyzers via a network comprises a measuring part which measures samples by the analyzers, an accuracy control data transmitting means which transmits the accuracy control data obtained by measuring the accuracy control samples by the measuring part to the control device via the network, an accuracy control data receiving means provided on the control device, an accuracy control means which implements an accuracy control based on the received data provided on the control device, a calibration uncertainty storage part which stores uncertainty of calibration of the analyzers, a measurement uncertainty calculating means which calculates for each analyzer the uncertainty of measurement by the analyzers based on the calibration uncertainty and the accuracy control data, an accuracy control result outputting means which outputs a result of the accuracy control, and a means for outputting the uncertainty of measurement calculated by the calculating means. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008076267(A) 申请公布日期 2008.04.03
申请号 JP20060256702 申请日期 2006.09.22
申请人 SYSMEX CORP 发明人 YAMAGUCHI TADAYUKI;SHIRAKAMI ATSUSHI;SHINKAI ETSURO;OCHI YASUHIRO
分类号 G01N35/00 主分类号 G01N35/00
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