发明名称 SEMICONDUCTOR DEVICE INCLUDING A GATE ELECTRODE HAVING A POLYMETAL STRUCTURE
摘要 A semiconductor device includes a gate electrode including a polysilicon layer, a tungsten silicide layer, a tungsten nitride layer, and a tungsten layer, which are arranged in this order as viewed from a silicon substrate. The polysilicon layer is doped with phosphor, and the tungsten silicide layer is doped with nitrogen. The polysilicon layer is additionally doped with nitrogen in the top portion thereof.
申请公布号 US2008061386(A1) 申请公布日期 2008.03.13
申请号 US20070853851 申请日期 2007.09.12
申请人 ELPIDA MEMORY, INC. 发明人 TAGUWA TETSUYA
分类号 H01L29/78 主分类号 H01L29/78
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