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发明名称
METHOD FOR PATTERN INSPECTION
摘要
申请公布号
KR100808652(B1)
申请公布日期
2008.02.29
申请号
KR20047020197
申请日期
2003.06.10
申请人
发明人
分类号
G01N21/956;G06T1/00;G06T7/00;H01L21/66
主分类号
G01N21/956
代理机构
代理人
主权项
地址
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