| 摘要 |
A semiconductor memory tester is provided to perform a test of a high speed memory efficiently by programming the test according to the parameter of a device without accompanying complex program processing. A semiconductor memory tester(100) judges whether a test target memory device(200) is in pass or fail. The semiconductor memory tester has a measurement part(B) comparing an expected value with an output of the test target memory device at a timing based on a clock outputted from the test target memory device. The measurement part has a comparator(141-14n) receiving output data of the test target memory device, a sampling part sampling the output of the comparator at comparison timing, and a fail judgement part(161-16n) judging PASS/FAIL of the test target memory device by comparing the output of the sampling part with the expected value.
|
