发明名称 SURFACE SHAPE MEASURING DEVICE, BY PHASE RECOVERY METHOD AND SURFACE SHAPE MEASUREMENT METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a surface shape measuring device and a surface shape measuring method, capable of three-dimensional shape measurements of not only a transparent but also an opaque inspection object. <P>SOLUTION: In the surface shape measuring device and the surface shape measuring method, an original image and a diffraction image can be acquired very efficiently by arranging a coherent light irradiation element, a non-coherent light irradiation element and a light distribution element on the upper parts of the inspection object between an imaging element and the inspection object, and not only two-dimensional but also three-dimensional measurements are made possible by using phase recovery method. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007303907(A) 申请公布日期 2007.11.22
申请号 JP20060131169 申请日期 2006.05.10
申请人 TOPPAN PRINTING CO LTD 发明人 KUBOTA MASASHI
分类号 G01B11/24;G06T1/00 主分类号 G01B11/24
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