发明名称 METHOD AT SPECTROMETRY FOR INVESTIGATION OF SAMPLES, WHERE THE SAMPLE CONTAINS AT LEAST TWO ELEMENTS
摘要 The invention is characterized by placing a sample of known concentrations of known elements in a spectrometer in a first step and measuring the intensity II, 12.... In of the different elements included in the sample, by relating known concentrations Cl, C2... Cn for the elements included in the sample to the measured intensities II, 12... In in a second step such as to calculate a fictive intensity for a 100%-pure element for each of the elements included; calculating calibration constants Kl, K2... Kn for each of the elements as the relationship between measured intensity II, 12... In and the calculated intensity of respective 100%-pure elements in a third step; placing a sample of unknown concentrations of said elements in the spectrometer and reading-off the intensity of the different elements in a fourth step; and in a fifth step calculating the concentration of respective elements in the last mentioned sample as the measured intensity multiplied by respective calibration constants for the elements present in the sample.
申请公布号 WO2007126371(A1) 申请公布日期 2007.11.08
申请号 WO2007SE50240 申请日期 2007.04.12
申请人 XRF ANALYTICAL AB;KUMBRANDT, LARS;MALMQVIST, JOHAN 发明人 KUMBRANDT, LARS;MALMQVIST, JOHAN
分类号 G01N23/223 主分类号 G01N23/223
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