发明名称 TEST PATTERN GENERATION PROGRAM AND METHOD, AND DISPLAY ADJUSTING PROGRAM USING THE TEST PATTERN
摘要 <p>A test pattern generation program forms a frame in which the value of a first element out of three color elements is varied depending on the value of a first coordinate of the frame and the value of a second element is varied depending on the value of a second coordinate of the frame; forms a plurality of frames in which the value of a third element not used in the generated frame is uniformly varied depending on the value of a time axis; and adjusts a display by using a test pattern in which the frames are sequentially displayed depending on the third element.</p>
申请公布号 WO2007108134(A1) 申请公布日期 2007.09.27
申请号 WO2006JP305875 申请日期 2006.03.23
申请人 FUJITSU LIMITED;MURASHITA, KIMITAKA;SHIMIZU, MASAYOSHI 发明人 MURASHITA, KIMITAKA;SHIMIZU, MASAYOSHI
分类号 H04N17/00;G09G3/20;G09G5/00 主分类号 H04N17/00
代理机构 代理人
主权项
地址