SEMICONDUCTOR MEMORY DEVICE

摘要

A semiconductor memory device is provided to test data failure detection precisely by fractionating a tested region, and to test the data failure transferred between a data input pad and a global input/output line by controlling an I/O sense amplifier. A global input/output line transmits data between the outside and a local input/output line(LIO/LIOB). An I/O sense amplifier(IOSA1~IOSA4) controls the data transfer to a global input/output line from the local input/output line. An I/O sense amplifier control part controls the I/O sense amplifier in response to a test mode signal to test a semiconductor memory device regardless of data outputted from a memory cell.