发明名称 |
SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME |
摘要 |
Provided are semiconductor devices and methods of fabricating the same. The methods may include forming a molding layer on a semiconductor substrate. A storage electrode passing through the molding layer is formed. A part of the storage electrode is exposed by partially etching the molding layer. A sacrificial oxide layer is formed by oxidizing the exposed part of the storage electrode. The partially-etched molding layer and the sacrificial oxide layer are removed. A capacitor dielectric layer is formed on the substrate of which the molding layer and the sacrificial oxide layer are removed. A plate electrode is formed on the capacitor dielectric layers. |
申请公布号 |
US2016197081(A1) |
申请公布日期 |
2016.07.07 |
申请号 |
US201615072521 |
申请日期 |
2016.03.17 |
申请人 |
Park Ki-Yeon;CHOI Jae-Hyoung;URAZAEV Vladimir;JEONG Jin-Ha |
发明人 |
Park Ki-Yeon;CHOI Jae-Hyoung;URAZAEV Vladimir;JEONG Jin-Ha |
分类号 |
H01L27/108;H01L21/283;H01L49/02;H01L21/311;H01L21/768 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
1. A method of fabricating a semiconductor device, comprising:
forming a molding layer on a semiconductor substrate; forming a first electrode passing through the molding layer; partially etching the molding layer to expose a part of the first electrode; forming a sacrificial oxide layer by naturally oxidizing the exposed part of the first electrode; removing the partially-etched molding layer and the sacrificial oxide layer; forming a dielectric layer on the substrate of which the molding layer and the sacrificial oxide layer are removed; and forming a second electrode on the dielectric layer. |
地址 |
Hwaseong-si KR |