发明名称 SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME
摘要 Provided are semiconductor devices and methods of fabricating the same. The methods may include forming a molding layer on a semiconductor substrate. A storage electrode passing through the molding layer is formed. A part of the storage electrode is exposed by partially etching the molding layer. A sacrificial oxide layer is formed by oxidizing the exposed part of the storage electrode. The partially-etched molding layer and the sacrificial oxide layer are removed. A capacitor dielectric layer is formed on the substrate of which the molding layer and the sacrificial oxide layer are removed. A plate electrode is formed on the capacitor dielectric layers.
申请公布号 US2016197081(A1) 申请公布日期 2016.07.07
申请号 US201615072521 申请日期 2016.03.17
申请人 Park Ki-Yeon;CHOI Jae-Hyoung;URAZAEV Vladimir;JEONG Jin-Ha 发明人 Park Ki-Yeon;CHOI Jae-Hyoung;URAZAEV Vladimir;JEONG Jin-Ha
分类号 H01L27/108;H01L21/283;H01L49/02;H01L21/311;H01L21/768 主分类号 H01L27/108
代理机构 代理人
主权项 1. A method of fabricating a semiconductor device, comprising: forming a molding layer on a semiconductor substrate; forming a first electrode passing through the molding layer; partially etching the molding layer to expose a part of the first electrode; forming a sacrificial oxide layer by naturally oxidizing the exposed part of the first electrode; removing the partially-etched molding layer and the sacrificial oxide layer; forming a dielectric layer on the substrate of which the molding layer and the sacrificial oxide layer are removed; and forming a second electrode on the dielectric layer.
地址 Hwaseong-si KR