A method of processing a probe element includes (a) providing a probe element comprising a first conductive material, and (b) coating only a tip portion of the probe element with a second conductive material.
申请公布号
EP1774345(A1)
申请公布日期
2007.04.18
申请号
EP20050778915
申请日期
2005.08.02
申请人
SV PROBE PTE LTD.
发明人
TUNABOYLU, BAHADIR;BEATSON, DAVID, T.;HMIEL, ANDREW
