发明名称 |
TRANSISTOR AND DISPLAY DEVICE USING THE SAME, ELECTRONIC EQUIPMENT, AND SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a transistor having a low contact resistance. <P>SOLUTION: This transistor comprises: a semiconductor film containing impurity elements imparting P-type or N-type; an insulating film disposed thereon; and an electrode or a wiring electrically connected to the semiconductor film through at least a contact hole formed in the insulating film, wherein in the semiconductor film, the concentration of the impurity elements contained in a deeper region than a predetermined depth is in a first range (1×10<SP>20</SP>/cm<SP>3</SP>or less) and the concentration of the impurity elements contained in a shallower region than a predetermined depth is in a second range (more than 1×10<SP>20</SP>/cm<SP>3</SP>); and in a deeper region than a portion of the semiconductor film which is contacted with the electrode or the wiring, the concentration of the impurity elements is in a first range. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007088432(A) |
申请公布日期 |
2007.04.05 |
申请号 |
JP20060218414 |
申请日期 |
2006.08.10 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
ISOBE ATSUO;SAITO KEIKO;SATO TOMOHIKO |
分类号 |
H01L29/786;G02F1/1368;G06K19/07;G06K19/077;H01L21/28;H01L21/336;H01L21/768;H01L23/522;H01L29/78;H01L51/50 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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