发明名称 Wafer-to-wafer alignments
摘要 Structures for aligning wafers and methods for operating the same. The structure includes (a) a first semiconductor wafer including a first capacitive coupling structure, and (b) a second semiconductor wafer including a second capacitive coupling structure. The first and second semiconductor wafers are in direct physical contact with each other via a common surface. If the first and second semiconductor wafers are moved with respect to each other by a first displacement distance of 1 nm in a first direction while the first and second semiconductor wafers are in direct physical contact with each other via the common surface, then a change of at least 10<SUP>-18 </SUP>F in capacitance of a first capacitor comprising the first and second capacitive coupling structures results. The first direction is essentially parallel to the common surface.
申请公布号 US7193423(B1) 申请公布日期 2007.03.20
申请号 US20050275112 申请日期 2005.12.12
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DALTON TIMOTHY JOSEPH;GAMBINO JEFFREY PETER;JAFFE MARK DAVID;LUCE STEPHEN ELLINWOOD;SPROGIS EDMUND JURIS
分类号 G01R27/26;G01R31/02 主分类号 G01R27/26
代理机构 代理人
主权项
地址