发明名称 POLARIZATION MEASURING DEVICE, EXPOSURE DEVICE AND EXPOSURE METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a polarization measuring device capable of miniaturization and cost reduction following a simple constitution, and capable of measuring the polarization state of light with accuracy required for an exposure device. <P>SOLUTION: This polarization measuring device is equipped with: an aperture member 21 having the first aperture 21a and the second aperture 21b adjacent mutually on a prescribed surface; the first polarizer 23a for emitting selectively the first linearly polarized light having a polarization direction in the first direction, in light entering through the first aperture; the second polarizer 23b for emitting selectively the second linearly polarized light having a polarization direction in the second direction approximately orthogonal to the first direction, in light entering through the second aperture; and photodetection parts 24a, 34b for detecting the first linearly polarized light emitted from the first polarizer and second linearly polarized light emitted from the second polarizer. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007057244(A) 申请公布日期 2007.03.08
申请号 JP20050239618 申请日期 2005.08.22
申请人 NIKON CORP 发明人 TANAKA HIROHISA
分类号 G01J4/04;H01L21/027 主分类号 G01J4/04
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