发明名称 Method and apparatus for affecting a portion of an integrated circuit
摘要 In one embodiment, an integrated circuit which uses one or more re-useable modules may use a signature generated by a duplicate state machine or an unmodified state machine to select, control, or otherwise affect a resource on the integrated circuit, where affecting the resource was not part of the original design and state diagram of the unmodified state machine. In one embodiment, a method and apparatus is provided for dynamically reconfiguring a plurality of test circuits in re-useable modules on an IC without modifying the controller state machine in the re-usable module.
申请公布号 US7185251(B2) 申请公布日期 2007.02.27
申请号 US20020157094 申请日期 2002.05.29
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 MOYER WILLIAM C.;BRUCE, JR. WILLIAM C.
分类号 G01R31/28;G01R31/3185;G06F7/00 主分类号 G01R31/28
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