| 摘要 |
An embodiment includes a dual interconnection form in which power/ground pads and signal pads of a semiconductor chip are electrically connected to a package substrate in different connection manners. First connection members that electrically connect the power/ground pads with the substrate have relatively large cross-sectional dimensions in comparison to its length, for example, solder bumps or gold bumps. Second connection members that electrically connect the signal pads with the substrate have relatively small cross-sectional dimensions in comparison its length, for example, conductive wires or beam leads. Such different ways of electrically connecting different kinds of pads with the substrate realize the most suitable electrical performance, effectively meeting the needs of high speed and low power consumption of the semiconductor devices.
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