发明名称 VERSATILE SYSTEM FOR CONDITIONING SLURRY IN CMP PROCESS
摘要 The present invention provides a system ( 100 ) for conditioning multi-component slurries utilized in chemical mechanical polishing (CMP) of semiconductor wafers ( 140 ). The system provides a first slurry component ( 108 ), and a second slurry component ( 120 ). A conditioning component ( 102 ) has first and second inlets, and an outlet operatively coupled to a dispensing system ( 138 ). First and second flow control components ( 116, 126 ) are operably intercoupled between the first and second inlets and the first and second slurry components, respectively. The system further provides a megasonic energy source ( 106 ), adapted to generate an energy field ( 118 ) across the conditioning component. A conveyance component ( 114 ) conducts the slurry components from the inlets through the energy field, and delivers a final mixture ( 136 ) of multi-component slurry to the outlet.
申请公布号 US2006276042(A1) 申请公布日期 2006.12.07
申请号 US20060465501 申请日期 2006.08.18
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 STARK DAVID A.;SCHULTZ LAURENCE D.;MURPHY NEAL T.
分类号 H01L21/461 主分类号 H01L21/461
代理机构 代理人
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