发明名称 |
RESIST PATTERN FORMING METHOD, ETCHING METHOD, AND METHOD FOR MANUFACTURING MASTER INFORMATION CARRIER |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for forming a resist pattern capable of dimensionally precisely and simply forming a pattern on the surface of the base substance, to provide an etching method, and to provide a method for forming a master information carrier. SOLUTION: The method for manufacturing the resist pattern comprises the steps of forming a first resist film 2 all over the surface of the base material 1, forming a second resist film 3 having an opening 3a on the first resist film 2, implanting an ion to the surface of the first resist film 2 in the opening 3a by the ion implantation method, and etching the first resist film 2 with the ion implantation layer 5 as a mask. In addition, the use of the resist pattern 7 can precisely etch the base material 1 or the thin film previously formed on the base material 1. The use of the method can also manufacture the master information carrier. COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2006310591(A) |
申请公布日期 |
2006.11.09 |
申请号 |
JP20050132001 |
申请日期 |
2005.04.28 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
FURUMURA NOBUYUKI;YOSHIMOTO KAZUYA |
分类号 |
H01L21/027;G03F7/40;G11B5/84;G11B5/86 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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