| 摘要 |
PROBLEM TO BE SOLVED: To transfer data accurately even when a defect occurs on a nonvolatile storage element for storing a data. SOLUTION: The semiconductor device comprises: a 1st nonvolatile storage element group 21 which includes a plurality of 1st nonvolatile storage elements with which information is programmed by electrically changing an element characteristic irreversibly; a verify circuit 23 for detecting a defective 1st nonvolatile storage element among the 1st nonvolatile storage element group 21; and a 2nd nonvolatile storage group 22 which includes a plurality of 2nd nonvolatile storage elements with which information is programmed by electrically changing an element characteristic irreversibly, and which stores address data for relieving the defective 1st nonvolatile storage element. COPYRIGHT: (C)2007,JPO&INPIT
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