| 摘要 |
Detecting an amount of change in light intensity caused by surface plasmon resonance includes coupling light having transverse magnetic and transverse electric polarization modes into a slab waveguide having a metallic film that supports the surface plasmon resonance, detecting the transverse magnetic and transverse electric polarized light as it emanates from the slab waveguide, and determining an instantaneous difference in intensities between the transverse magnetic and transverse electric polarization modes of the emanated light. A thickness of the metal film may be varied to shift a response curve of the surface plasmon resonance, and the materials of a slab waveguide substrate may be selected to have a thermo-optic coefficient that substantially matches that of a test sample under analysis.
|
