| 摘要 |
PROBLEM TO BE SOLVED: To provide a digital test device which tests analog semiconductor devices. SOLUTION: The digital test device comprises a low-frequency pass filter which passes only low-frequency analog signals among analog signals output from the analog semiconductor device, a rectifying part which converts and outputs the analog signal output from the low-frequency pass filter to a direct current voltage, connecting with the low-frequency pass filter, a high-frequency pass filter which passes only the high-frequency analog signals from among analog signals output from the analog semiconductor devices, a high-frequency power detector part which converts and outputs the analog signal output from the high-frequency pass filter to the direct current voltage, connecting with the high-frequency pass filter, a digital measuring part which decides the quality of the analog signal output from the analog semiconductor device, by measuring the output signal voltage from the rectifying part and the output signal voltage from the high-frequency power detector part, connecting the rectifying part and the high-frequency power detector part in common. COPYRIGHT: (C)2006,JPO&NCIPI
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