发明名称 |
Method for estimating long term end-of-life characteristics using short-term data for lithium/silver vanadium oxide cells |
摘要 |
The present invention is directed to a method for analyzing the tail-end behavior of a lithium cell having a solid cathode. The tail of a longer-term accelerated discharge data (ADD) test is estimated from the tail of two shorter-term ADD tests. This is accomplished by first comparing the discharge tails of shorter-term ADD tests and determining angles or rotation that correspond to Rdc growth, and then trending rotation angles versus time to reach a give DoD. For example, the 18-month and 36-month ADD test tails are used to estimate the ADD test tail of a similarly constructed cell subjected to a longer-term ADD test, for example a 48-month ADD test.
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申请公布号 |
US7092830(B2) |
申请公布日期 |
2006.08.15 |
申请号 |
US20050087302 |
申请日期 |
2005.03.23 |
申请人 |
WILSON GREATBATCH TECHNOLOGIES, INC. |
发明人 |
SYRACUSE KENNETH;WAITE NOELLE;GAN HONG;TAKEUCHI ESTHER S. |
分类号 |
G01R31/36;G06F19/00 |
主分类号 |
G01R31/36 |
代理机构 |
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地址 |
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