发明名称 Method for estimating long term end-of-life characteristics using short-term data for lithium/silver vanadium oxide cells
摘要 The present invention is directed to a method for analyzing the tail-end behavior of a lithium cell having a solid cathode. The tail of a longer-term accelerated discharge data (ADD) test is estimated from the tail of two shorter-term ADD tests. This is accomplished by first comparing the discharge tails of shorter-term ADD tests and determining angles or rotation that correspond to Rdc growth, and then trending rotation angles versus time to reach a give DoD. For example, the 18-month and 36-month ADD test tails are used to estimate the ADD test tail of a similarly constructed cell subjected to a longer-term ADD test, for example a 48-month ADD test.
申请公布号 US7092830(B2) 申请公布日期 2006.08.15
申请号 US20050087302 申请日期 2005.03.23
申请人 WILSON GREATBATCH TECHNOLOGIES, INC. 发明人 SYRACUSE KENNETH;WAITE NOELLE;GAN HONG;TAKEUCHI ESTHER S.
分类号 G01R31/36;G06F19/00 主分类号 G01R31/36
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