发明名称 Method for fabricating semiconductor device
摘要 The present invention relates to a method for fabricating a semiconductor device. The method comprises the steps of: 1. A method for fabricating a semiconductor device, which comprises the steps of: forming a gate line on a semiconductor substrate; forming junction regions in the semiconductor substrate at both sides of the gate line; forming and selectively removing an interlayer insulating film on the substrate to form contact holes exposing the junction regions; forming plugs in the contact holes; and implanting impurity ions into the plugs; and annealing the junction regions.
申请公布号 KR100608352(B1) 申请公布日期 2006.08.09
申请号 KR20030013716 申请日期 2003.03.05
申请人 发明人
分类号 H01L21/336;H01L21/425;H01L21/44;H01L21/8238;H01L21/8239;H01L21/8242 主分类号 H01L21/336
代理机构 代理人
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