发明名称 Single metal gate CMOS device design
摘要 A semiconductor device includes a PMOS transistor formed on a substrate structure. The PMOS transistor includes a source and a drain each including a diffusion region in the substrate structure, a channel region defined between the source and the drain, a gate dielectric over the channel region, and a gate electrode over the gate dielectric. The gate electrode is formed of a material having an n-type work function with respect to the semiconductor substrate and is treated such that a work function of the gate electrode is converted into a mid-gap type or p-type work function with respect to the semiconductor substrate.
申请公布号 US2006172480(A1) 申请公布日期 2006.08.03
申请号 US20050048877 申请日期 2005.02.03
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 WANG CHIH-HAO;CHEN SHANG-CHIH;TSAI CHING-WEI
分类号 H01L21/8238;H01L21/3205;H01L21/8234 主分类号 H01L21/8238
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