发明名称 Wire bonds having pressure-absorbing balls
摘要 A semiconductor device with a chip having at least one metallic bond pad ( 101 ) over weak insulating material ( 102 ). In contact with this bond pad is a flattened metal ball ( 104 ) made of at least 99.999 % pure metal such as gold, copper, or silver. The diameter ( 104 a) of the flattened ball is less than or equal to the diameter ( 103 a) of the bond pad. A wire ( 110 ) is connected to the bond pad so that the wire has a thickened portion ( 111 ) conductively attached to the flattened metal ball. The wire is preferably made of composed metal such as gold alloy. The composition of the flattened ball is softer than the wire. This softness of the flattened ball protects the underlying insulator against damage caused by pressure or stress, when the composed ball is attached.
申请公布号 US2006144907(A1) 申请公布日期 2006.07.06
申请号 US20040026840 申请日期 2004.12.30
申请人 发明人 KADOGUCHI SOHICHI;KAWAKAMI NORIHIRO
分类号 B23K31/02 主分类号 B23K31/02
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