发明名称 MOSFET and method for fabricating the same
摘要 The semiconductor device of the present invention includes: a gate insulating film formed on a semiconductor region of a first conductivity type; a gate electrode formed on the gate insulating film; and a channel doped layer of the first conductivity type formed in the semiconductor region beneath the gate electrode. The channel doped layer contains carbon as an impurity.
申请公布号 EP1641046(A2) 申请公布日期 2006.03.29
申请号 EP20050019440 申请日期 2005.09.07
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD 发明人 NODA, TAIJI
分类号 H01L29/78;H01L21/225;H01L21/265;H01L21/336;H01L29/10 主分类号 H01L29/78
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